Variable | Pseudo-F | p | % var. |
---|---|---|---|
(A) Marginal test | |||
Urchin density | 6.297 | 0.0002 | 7.06 |
Wave exposure | 28.378 | 0.0001 | 15.38 |
Productivity | 26.30 | 0.0001 | 14.22 |
Depth | 3.147 | 0.014 | 2.59 |
Substrate roughness | 7.495 | 0.0001 | 7.97 |
Variable | Pseudo-F | p | % var. | Com. % var. |
---|---|---|---|---|
(B) Sequencial test | ||||
Wave exposure | 30.152 | 0.0001 | 15.17 | 15.17 |
Urchin density | 9.353 | 0.0001 | 7.11 | 22.28 |
Substrate roughness | 8.574 | 0.0001 | 6.47 | 28.76 |
Productivity | 6.633 | 0.0003 | 5.20 | 33.96 |
Depth | 3.147 | 0.015 | 2.59 | 36.56 |